Structure Determination Methods of Materials Science I. Exam Topics
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        1.    Charged-particle sources (linear accelerators, cyclotron,
        synchrotron)
        2.    X-ray sources (conventional X-ray source, synchrotron
        radiation)
        3.    Detectors I. (gas filled and solid state detectors,
        signal processing: MCA)
        4.    Detectors II. (imaging detectors)
        5.    Diffraction methods I. (kinematic scattering theory,
        scattering of amorphous and crystalline materials, Bragg-condition)
        6.    Diffraction methods II. (Ewald-construction, dividing the
        amplitude into groups: structure factor, atomic form factor)
        7.    Single- and policrystal diffraction methods (rotating crystal
        method, Laue- and powder diffraction), information in the shape of
        profiles
	8.    Properties of X-ray, neutron- and electron diffraction,
        comparing the methods
	9.   Transmission Electron Microscopy (TEM)
        10.   Scanning Electron Microscopy (SEM)
        11.   EBSD, FIB
        12.   Scanning Probe Microscopes: STM, AFM
	13.   Microstructure determination methods (evaluating crystallite
	size and crystal defects from XRD patterns)
	14.   High energy ion spectroscopy (RBS, channeling, ERD, PIXE)
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