|Department of Materials Physics||Institute of Physics||Eötvös Loránd University|
ResearchI'm interested in X-ray line profile analysis (XLPA) for the characterization of microstructures, especially the size and distribution of crystallites, the shape anisotropy of crystallites, the density, character and distribution of dislocations and the density and type of stacking faults and twin boundaries. I've developed together with co-authors new methods for the extraction of microstructural parameters from X-ray measurements: (a) by fitting simultaneously the whole Fourier transforms or intensity profiles: the method Multiple Whole Profile Fitting (MWP) (b) by the convolutional fitting of the whole diffraction spectrum: the method of Convolutional Multiple Whole Profile Fitting (CMWP). The methods were applied for the characterization of the microstructure of most different crystalline materials, e.g. metals, alloys, ceramic materials, minerals or polymers. I'm also interested in variable stars.